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A Capacitance-to-Frequency Converter suitable for Single-Element and Differential Capacitive Sensors

A Capacitance-to-Frequency Converter suitable for Single-Element and Differential Capacitive Sensors

Date13th Aug 2020

Time03:00 PM

Venue Google Meet

PAST EVENT

Details

Capacitive sensors play a key role in myriad fields such as consumer electronics, automotive sensors, and industrial applications. These sensors have an established record of providing sensor designers with an attractive option to realize non-contact measurement of various physical parameters. The measurement scheme, comprising the sensor-interface electronics, plays an important role in deriving the best out of a given sensing element. One such scheme, namely, a novel capacitance-to-frequency converter (CFC) will be presented in this seminar. The proposed CFC is capable of measuring from either a single-element or a differential capacitive sensor, providing ratio and ratio-metric outputs, respectively. Most of the existing auto-balancing schemes for capacitive sensors require precise sinusoidal AC excitation and provide an output that is sensitive to parasitic capacitances. Also, the use of voltage-controlled resistors (VCR) in many of these schemes limits the linearity and accuracy of their output. The developed CFC employs a simple DC reference for excitation, and gives a digital output that is insensitive to parasitic capacitances, by virtue of design. Additionally, the output is linear, irrespective of the sensor characteristic being either linear or inverse in nature, and independent of the nominal value of the sensor. This feature, along with its compatibility with single-element and differential capacitive sensors, facilitates its ease of integration with a wide range of capacitive sensors. The CFC has a simple, but effective, one-time correction mechanism that significantly reduces the impact of component mismatch. The prototype of the proposed scheme exhibits a maximum non-linearity error of 0.24%, a resolution of 12.59 effective number of bits. The details of the development and test results will be presented in the seminar.

Speakers

Ms. Lakshmi Areekath(EE17D014)

Department of Electrical Engineering